Publikationen

T. Thenikl, H. Vallen, "Comparison of Approximate and Simple Location Methods for AE-Sources on Dished Headsd", 31st EWGAE, 2014

H. Vallen, G. Corneanu, T. Thenikl, T. Duschl, "A New File Format Grants User Written Software Access to all Kind of Acquired Data", 31st EWGAE, 2014

H. Vallen, G. Corneanu, T. Thenikl, T. Duschl, "A New 'Duration-Adapted TR' Waveform Capture Method Eliminates Severe Limitations", 31st EWGAE, 2014

T. Thenikl, H. Vallen, "Vergleich der Ortungsergebnisse von Schallquellen auf einem Halbkugelboden, wenn dieser mit unterschiedlichen Abbildungsvorschriften auf eine Ebene projiziert wird", 19. Kolloquium Schallemission, DGZfP, 2013

H. Vallen, G. Corneanu, T. Thenikl, "Der Nutzen der Speicherung von AE Daten in einem modernen Datenbankformat", 19. Kolloquium Schallemission, DGZfP, 2013

T. Thenikl, H. Vallen, D. Aljets, "Location of Leaks in Liquid Filled Pipelines Under Operation", 30th EWGAE, 2012

H. Vallen, T. Thenikl, "New Intrinsically Safe Acoustic Emission Sensor System for Use on Tank Ships", 30th EWGAE, 2012

H. Vallen, T. Thenikl, "Intrinsically safe acoustic emission equipment opens the door to permanent monitoring applications in the oil and gas industry", WCNDT 2012

H. Vallen, T. Thenikl, "Anwendungsbeispiel für einen nach ATEX zertifizierten, eigensicheren AE-Sensor", DGZfP 2011

T. Thenikl, S. Guk, H. Vallen, "Interaction between material flow and microstructure evolution with acoustic emission measurement", MEFORM 2011

H. Vallen, J. Vallen, T. Thenikl, "New developments in the field of AE systems, sensors & software", 29th EWGAE, 2010

T. Thenikl, "Analysis of the Interaction of Process Induced Stress Fields and Dislocations in Silicon Devices", Institut für Festkörperphysik, 2002. http://www.ifp.tuwien.ac.at/49.0.html

T. Thenikl, J. Wosik, K. Spiradek-Hahn, A. Czyrska-Filemonowicz, "TEM investigations of the microstructure of surface treated {Ti}-based alloys for prosthesis applications", ESB 2002 : 17th European conference on Biomaterials

H. Cerva; M. Engelhardt; M. Hierlemann; M. Pölzl; T. Thenikl, "Misfortune, challenge, and success: defects in processed semiconductor devices",Physica B (December 2001), 308-310, pg. 13-17